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Materials Science In Semiconductor Processing

Materials Science In Semiconductor ProcessingSCIE

國際簡稱:MAT SCI SEMICON PROC  參考譯名:半導(dǎo)體加工中的材料科學(xué)

  • 中科院分區(qū)

    3區(qū)

  • CiteScore分區(qū)

    Q1

  • JCR分區(qū)

    Q2

基本信息:
ISSN:1369-8001
E-ISSN:1873-4081
是否OA:未開放
是否預(yù)警:否
TOP期刊:否
出版信息:
出版地區(qū):ENGLAND
出版商:Elsevier Ltd
出版語言:English
出版周期:Bimonthly
出版年份:1998
研究方向:工程技術(shù)-材料科學(xué):綜合
評(píng)價(jià)信息:
影響因子:4.2
H-index:49
CiteScore指數(shù):8
SJR指數(shù):0.732
SNIP指數(shù):0.992
發(fā)文數(shù)據(jù):
Gold OA文章占比:5.21%
研究類文章占比:96.22%
年發(fā)文量:635
自引率:0.0487...
開源占比:0.0145
出版撤稿占比:0
出版國人文章占比:0.21
OA被引用占比:0.0123...
英文簡介 期刊介紹 CiteScore數(shù)據(jù) 中科院SCI分區(qū) JCR分區(qū) 發(fā)文數(shù)據(jù) 常見問題

英文簡介Materials Science In Semiconductor Processing期刊介紹

Materials Science in Semiconductor Processing provides a unique forum for the discussion of novel processing, applications and theoretical studies of functional materials and devices for (opto)electronics, sensors, detectors, biotechnology and green energy.

Each issue will aim to provide a snapshot of current insights, new achievements, breakthroughs and future trends in such diverse fields as microelectronics, energy conversion and storage, communications, biotechnology, (photo)catalysis, nano- and thin-film technology, hybrid and composite materials, chemical processing, vapor-phase deposition, device fabrication, and modelling, which are the backbone of advanced semiconductor processing and applications.

Coverage will include: advanced lithography for submicron devices; etching and related topics; ion implantation; damage evolution and related issues; plasma and thermal CVD; rapid thermal processing; advanced metallization and interconnect schemes; thin dielectric layers, oxidation; sol-gel processing; chemical bath and (electro)chemical deposition; compound semiconductor processing; new non-oxide materials and their applications; (macro)molecular and hybrid materials; molecular dynamics, ab-initio methods, Monte Carlo, etc.; new materials and processes for discrete and integrated circuits; magnetic materials and spintronics; heterostructures and quantum devices; engineering of the electrical and optical properties of semiconductors; crystal growth mechanisms; reliability, defect density, intrinsic impurities and defects.

期刊簡介Materials Science In Semiconductor Processing期刊介紹

《Materials Science In Semiconductor Processing》自1998出版以來,是一本工程技術(shù)優(yōu)秀雜志。致力于發(fā)表原創(chuàng)科學(xué)研究結(jié)果,并為工程技術(shù)各個(gè)領(lǐng)域的原創(chuàng)研究提供一個(gè)展示平臺(tái),以促進(jìn)工程技術(shù)領(lǐng)域的的進(jìn)步。該刊鼓勵(lì)先進(jìn)的、清晰的闡述,從廣泛的視角提供當(dāng)前感興趣的研究主題的新見解,或?qū)彶槎嗄陙砟硞€(gè)重要領(lǐng)域的所有重要發(fā)展。該期刊特色在于及時(shí)報(bào)道工程技術(shù)領(lǐng)域的最新進(jìn)展和新發(fā)現(xiàn)新突破等。該刊近一年未被列入預(yù)警期刊名單,目前已被權(quán)威數(shù)據(jù)庫SCIE收錄,得到了廣泛的認(rèn)可。

該期刊投稿重要關(guān)注點(diǎn):

Cite Score數(shù)據(jù)(2024年最新版)Materials Science In Semiconductor Processing Cite Score數(shù)據(jù)

  • CiteScore:8
  • SJR:0.732
  • SNIP:0.992
學(xué)科類別 分區(qū) 排名 百分位
大類:Engineering 小類:Mechanical Engineering Q1 87 / 672

87%

大類:Engineering 小類:Condensed Matter Physics Q1 59 / 434

86%

大類:Engineering 小類:Mechanics of Materials Q1 60 / 398

85%

大類:Engineering 小類:General Materials Science Q1 100 / 463

78%

CiteScore 是由Elsevier(愛思唯爾)推出的另一種評(píng)價(jià)期刊影響力的文獻(xiàn)計(jì)量指標(biāo)。反映出一家期刊近期發(fā)表論文的年篇均引用次數(shù)。CiteScore以Scopus數(shù)據(jù)庫中收集的引文為基礎(chǔ),針對(duì)的是前四年發(fā)表的論文的引文。CiteScore的意義在于,它可以為學(xué)術(shù)界提供一種新的、更全面、更客觀地評(píng)價(jià)期刊影響力的方法,而不僅僅是通過影響因子(IF)這一單一指標(biāo)來評(píng)價(jià)。

歷年Cite Score趨勢(shì)圖

中科院SCI分區(qū)Materials Science In Semiconductor Processing 中科院分區(qū)

中科院 2023年12月升級(jí)版 綜述期刊:否 Top期刊:否
大類學(xué)科 分區(qū) 小類學(xué)科 分區(qū)
工程技術(shù) 3區(qū) ENGINEERING, ELECTRICAL & ELECTRONIC 工程:電子與電氣 MATERIALS SCIENCE, MULTIDISCIPLINARY 材料科學(xué):綜合 PHYSICS, APPLIED 物理:應(yīng)用 PHYSICS, CONDENSED MATTER 物理:凝聚態(tài)物理 3區(qū) 3區(qū) 3區(qū) 3區(qū)

中科院分區(qū)表 是以客觀數(shù)據(jù)為基礎(chǔ),運(yùn)用科學(xué)計(jì)量學(xué)方法對(duì)國際、國內(nèi)學(xué)術(shù)期刊依據(jù)影響力進(jìn)行等級(jí)劃分的期刊評(píng)價(jià)標(biāo)準(zhǔn)。它為我國科研、教育機(jī)構(gòu)的管理人員、科研工作者提供了一份評(píng)價(jià)國際學(xué)術(shù)期刊影響力的參考數(shù)據(jù),得到了全國各地高校、科研機(jī)構(gòu)的廣泛認(rèn)可。

中科院分區(qū)表 將所有期刊按照一定指標(biāo)劃分為1區(qū)、2區(qū)、3區(qū)、4區(qū)四個(gè)層次,類似于“優(yōu)、良、及格”等。最開始,這個(gè)分區(qū)只是為了方便圖書管理及圖書情報(bào)領(lǐng)域的研究和期刊評(píng)估。之后中科院分區(qū)逐步發(fā)展成為了一種評(píng)價(jià)學(xué)術(shù)期刊質(zhì)量的重要工具。

歷年中科院分區(qū)趨勢(shì)圖

JCR分區(qū)Materials Science In Semiconductor Processing JCR分區(qū)

2023-2024 年最新版
按JIF指標(biāo)學(xué)科分區(qū) 收錄子集 分區(qū) 排名 百分位
學(xué)科:ENGINEERING, ELECTRICAL & ELECTRONIC SCIE Q2 89 / 352

74.9%

學(xué)科:MATERIALS SCIENCE, MULTIDISCIPLINARY SCIE Q2 158 / 438

64%

學(xué)科:PHYSICS, APPLIED SCIE Q2 51 / 179

71.8%

學(xué)科:PHYSICS, CONDENSED MATTER SCIE Q2 25 / 79

69%

按JCI指標(biāo)學(xué)科分區(qū) 收錄子集 分區(qū) 排名 百分位
學(xué)科:ENGINEERING, ELECTRICAL & ELECTRONIC SCIE Q2 113 / 354

68.22%

學(xué)科:MATERIALS SCIENCE, MULTIDISCIPLINARY SCIE Q2 125 / 438

71.58%

學(xué)科:PHYSICS, APPLIED SCIE Q2 47 / 179

74.02%

學(xué)科:PHYSICS, CONDENSED MATTER SCIE Q1 19 / 79

76.58%

JCR分區(qū)的優(yōu)勢(shì)在于它可以幫助讀者對(duì)學(xué)術(shù)文獻(xiàn)質(zhì)量進(jìn)行評(píng)估。不同學(xué)科的文章引用量可能存在較大的差異,此時(shí)單獨(dú)依靠影響因子(IF)評(píng)價(jià)期刊的質(zhì)量可能是存在一定問題的。因此,JCR將期刊按照學(xué)科門類和影響因子分為不同的分區(qū),這樣讀者可以根據(jù)自己的研究領(lǐng)域和需求選擇合適的期刊。

歷年影響因子趨勢(shì)圖

發(fā)文數(shù)據(jù)

2023-2024 年國家/地區(qū)發(fā)文量統(tǒng)計(jì)
  • 國家/地區(qū)數(shù)量
  • CHINA MAINLAND376
  • India309
  • South Korea97
  • Turkey76
  • Mexico73
  • Japan71
  • Iran65
  • USA63
  • Saudi Arabia55
  • Italy48

本刊中國學(xué)者近年發(fā)表論文

  • 1、V2O5 nanobelts via a facile water-assisted strategy boosting electrochromic performance

    Author: Sun, Haohao; Wang, Wenxuan; Fan, Qiongzhen; Qi, Yanyuan; Xiong, Yuli; Jian, Zelang; Chen, Wen

    Journal: MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. 2023; Vol. 155, Issue , pp. -. DOI: 10.1016/j.mssp.2022.107265

  • 2、Ag/Ag3PO4 nanoparticles assembled on sepiolite nanofibers: Enhanced visible-light-driven photocatalysis and the important role of Ag decoration

    Author: Ren, Xiaofei; Hu, Guicong; Guo, Qingbin; Gao, Dengzheng; Wang, Li; Hu, Xiaolong

    Journal: MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. 2023; Vol. 156, Issue , pp. -. DOI: 10.1016/j.mssp.2022.107272

  • 3、Exploring the effect of oxygen environment on the Mo/CdTe/CdSe solar cell substrate configuration

    Author: Yang, Xiutao; Long, Yuchen; Zheng, Yujie; Wang, Jiayi; Zhou, Biao; Xie, Shenghui; Li, Bing; Zhang, Jingquan; Hao, Xia; Karazhanov, Smagul; Zeng, Guanggen; Feng, Lianghuan

    Journal: MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. 2023; Vol. 156, Issue , pp. -. DOI: 10.1016/j.mssp.2022.107267

  • 4、Slag refining at various viscosity conditions for SiC inclusion removal during Si scraps recycling

    Author: Pan, Di; Jiang, Dachuan; Hu, Zhiqiang; Li, Pengting; Tan, Yi; Li, Jin; Li, Jiayan

    Journal: MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. 2023; Vol. 156, Issue , pp. -. DOI: 10.1016/j.mssp.2022.107274

  • 5、Fabrication of interface-engineered Ni/NiO/rGO nanobush for highly efficient and durable oxygen reduction

    Author: Wang, Yanan; Duan, Chunyang; Li, Junhua; Zhao, Zenghua; Xu, Jiasheng; Liu, Lin; Qian, Jianhua

    Journal: MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. 2023; Vol. 156, Issue , pp. -. DOI: 10.1016/j.mssp.2022.107259

  • 6、The structural, mechanical and electronic properties of BaxNy compounds

    Author: Wang, Gao-Min; Zeng, Wei; Zhang, Fan; Li, Xing-Han; Liu, Fu-Sheng; Tang, Bin; Zhong, Mi; Liu, Qi-Jun

    Journal: MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. 2023; Vol. 156, Issue , pp. -. DOI: 10.1016/j.mssp.2022.107268

  • 7、Synergistic effect of 1,2,4-triazole and phytic acid as inhibitors on copper film CMP for ruthenium- based copper interconnected and the surface action mechanism analysis

    Author: Luo, Fu; Niu, Xinhuan; Yan, Han; Zhang, Yinchan; Qu, Minghui; Zhu, Yebo; Hou, Ziyang

    Journal: MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. 2023; Vol. 156, Issue , pp. -. DOI: 10.1016/j.mssp.2022.107276

  • 8、Hyperspectral camouflage coating using Palygorskite to simulate water absorption of healthy green leaves

    Author: Lu, Haipeng; Bai, Xingzhi; Wang, Zhenxiong; Guo, Yang; Zhang, Li; Weng, Xiaolong; Xie, Jianliang; Liang, Difei; Deng, Longjiang

    Journal: MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. 2023; Vol. 156, Issue , pp. -. DOI: 10.1016/j.mssp.2022.107293

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